本数据集源于高纯稀土氧化物和卤化物试剂痕量杂质元素GD-MS分析方法研究过程，主要针对现有的分析方法不满足高纯稀土氧化物和卤化物中关键敏感元素含量的检测需求，开展高纯稀土氧化物和卤化物中痕量元素的GD-MS分析方法研究，内容涵盖仪器最佳工作参数、干扰校正、结果校正数据、方法检出限及精密度数据，形成标准化分析方法及配套标准数据集，实现Co、Mn、Ni等敏感元素检出限不大于0.01 ppm。满足科研领域对高端稀土试剂的检测需要，支撑稀土战略资源在科研试剂领域的高值化、多功能化应用。
", "ds_source": "本数据集数据源为高纯稀土氧化物和卤化物试剂中痕量杂质元素的分析检测数据，采用辉光放电质谱（GD-MS）仪器完成样品分析测试，形成高纯稀土氧化物、卤化物和类卤化物痕量元素超低检出限分析方法9项。具体试验过程包括：①基于第二阴极辅助放电技术研究样品预处理方法，系统考察样品粉末粒度、放电电流、预溅射时间、离子源温度等因素对检测信号强度和稳定性的影响，确定仪器最佳工作参数；②通过GD-MS仪器采集待测元素质谱信号，分析质谱干扰情况并研究干扰消除方法，考察方法检出限；③以标准物质/样品和仪器自带的相对灵敏度因子（RSF）为参照，考察其对测定结果的校正效果；④考察分析方法的精密度，采用现行国家标准GB/T 12690和GB/T 18115系列中规定的分析方法进行验证比对，最终建立痕量杂质元素分析方法，实现关键敏感金属元素检出限达到0.01 ppm以下。本数据加工方法基于上述试验数据源，通过规范化流程完成数据采集、干扰校正、结果校准及方法验证，最终输出准确、可靠的痕量杂质元素分析数据及配套标准数据集。
", "ds_process_way": "本数据加工方法基于辉光放电质谱（GD-MS）技术，针对高纯稀土氧化物和卤化物试剂中痕量杂质元素分析测试，结合第二阴极辅助放电技术，通过规范化流程完成数据采集、干扰校正、结果校准及方法验证，同步输出准确、可靠的痕量杂质元素分析数据及配套标准数据集，采用Nu Astrum Data Analysis Software软件对试验测量数据进行处理，汇总整理为PDF格式的分析方法及标准文件。该方法基于第二阴极辅助放电技术，系统考察放电电压、电流、气体流量等辉光放电关键参数。分析质谱干扰，消除干扰因素对检测数据的影响。以仪器自带相对灵敏度因子或内控样品对测量结果数据进行校正，提升数据准确性。批量采集样品检测数据，通过数理统计方法计算方法检出限、精密度等相关数据，形成高纯稀土氧化物和卤化物试剂痕量杂质元素GD-MS分析方法及配套标准数据集。
", "ds_quality": "本资源来源于基于GD-MS技术开展的高纯氧化物、无水卤化物和类卤化物中痕量杂质元素超低检出限分析方法的研究过程。数据采集在国合通测电子材料实验室中进行，采用Nu Astrum型辉光放电质谱仪，时间跨度与整个方法研发周期同步。采用Nu Astrum Data Analysis Software软件对试验测量数据进行处理，将仪器信号强度值转换为待测元素的含量值。质量控制措施的核心是标准化与可溯源性。本方法开发时严格遵循GD-MS分析技术的基本原理和研究流程，基于第二阴极辅助放电技术，通过大量实验研究，确定最优的试验条件，以仪器自带的相对灵敏度因子或实验室自制的质控样品，确保方法的准确性。依据GB/T 1.1-2020等标准规范的要求，编制企业标准。
", "ds_acq_start_time": "2022-11-01 00:00:00", "ds_acq_end_time": "2025-12-31 00:00:00", "ds_acq_place": "", "ds_acq_lon_east": null, "ds_acq_lat_south": null, "ds_acq_lon_west": null, "ds_acq_lat_north": null, "ds_acq_alt_low": null, "ds_acq_alt_high": null, "ds_share_type": "apply-access", "ds_total_size": 25111990, "ds_files_count": 0, "ds_format": "*.pdf，*.docx", "ds_space_res": "", "ds_time_res": "", "ds_coordinate": "无", "ds_projection": "", "ds_thumbnail": "8bd483c6-6fa9-4e73-abbe-56e294d160cb.png", "ds_thumb_from": 2, "ds_ref_way": "", "paper_ref_way": "", "ds_ref_instruction": "", "ds_from_station": "", "organization_id": "af683ce0-400b-4f2f-9242-f45f0621e11a", "ds_serv_man": "李红星", "ds_serv_phone": "0931-4967592", "ds_serv_mail": "ncdc@lzb.ac.cn", "doi_value": "", "subject_codes": [ "410" ], "quality_level": 0, "publish_time": "2026-05-25 11:50:13", "last_updated": "2026-05-25 11:53:10", "protected": false, "protected_to": null, "lang": "zh", "cstr": "11738.11.ncdc.gcxtsj.db7387.2026", "i18n": { "en": { "title": "GD-MS analysis methods and standard technical solutions for trace impurities in high-purity rare earth oxides and halide reagents", "ds_format": "*.pdf，*.docx", "ds_source": "The data source of this dataset is the analysis and detection data of trace impurity elements in high-purity rare earth oxide and halide reagents. The sample analysis and testing were completed using a glow discharge mass spectrometry (GD-MS) instrument, forming 9 ultra-low detection limit analysis methods for trace elements in high-purity rare earth oxide, halide, and halide like reagents. The specific experimental process includes: ① studying the sample pretreatment method based on the second cathode assisted discharge technology, systematically examining the influence of factors such as sample powder particle size, discharge current, pre sputtering time, ion source temperature, etc. on the detection signal strength and stability, and determining the optimal operating parameters of the instrument; ② Collect mass spectrometry signals of the tested elements using GD-MS instruments, analyze mass spectrometry interference, study interference elimination methods, and investigate the detection limit of the methods; ③ Using standard reference materials/samples and the relative sensitivity factor (RSF) provided by the instrument as a reference, examine their correction effect on the measurement results; ④ The precision of the analytical method was evaluated, and the analytical methods specified in the current national standards GB/T 12690 and GB/T 18115 series were used for verification and comparison. Finally, a trace impurity element analysis method was established to achieve a detection limit of less than 0.01 ppm for key sensitive metal elements. This data processing method is based on the experimental data source mentioned above, and completes data collection, interference correction, result calibration, and method validation through standardized processes. The final output is accurate and reliable trace impurity element analysis data and supporting standard dataset.
", "ds_quality": "This resource is derived from the research process of ultra-low detection limit analysis methods for trace impurity elements in high-purity oxides, anhydrous halides, and halides based on GD-MS technology. The data collection was conducted in the Guohe Tongce Electronic Materials Laboratory using a Nu Astrum glow discharge mass spectrometer, with a time span synchronized with the entire method development cycle. Use Nu Astrum Data Analysis Software to process the experimental measurement data and convert the instrument signal intensity values into the content values of the elements to be measured. The core of quality control measures is standardization and traceability. The development of this method strictly follows the basic principles and research process of GD-MS analysis technology. Based on the second cathode assisted discharge technology, the optimal experimental conditions are determined through extensive experimental research. The accuracy of the method is ensured by the relative sensitivity factor provided by the instrument or the self-made quality control samples in the laboratory. According to the requirements of standards and specifications such as GB/T 1.1-2020, prepare enterprise standards.
", "ds_ref_way": "", "ds_abstract": "This dataset is derived from the research process of GD-MS analysis method for trace impurity elements in high-purity rare earth oxides and halides reagents. It mainly focuses on the existing analysis methods that do not meet the detection requirements of key sensitive elements in high-purity rare earth oxides and halides. The research on GD-MS analysis method for trace elements in high-purity rare earth oxides and halides covers the optimal working parameters of the instrument, interference correction, result correction data, method detection limit and precision data, forming standardized analysis methods and supporting standard datasets, achieving a detection limit of no more than 0.01 ppm for sensitive elements such as Co, Mn, Ni, etc. Meet the detection needs of high-end rare earth reagents in the scientific research field, and support the high-value and multifunctional application of rare earth strategic resources in the field of scientific research reagents.
", "ds_time_res": "", "ds_acq_place": "", "ds_space_res": "", "ds_projection": "", "ds_process_way": "This data processing method is based on glow discharge mass spectrometry (GD-MS) technology, targeting the analysis and testing of trace impurity elements in high-purity rare earth oxides and halide reagents. Combined with the second cathode assisted discharge technology, data acquisition, interference correction, result calibration, and method validation are completed through standardized processes. Accurate and reliable trace impurity element analysis data and supporting standard datasets are synchronously output. The experimental measurement data is processed using Nu Astrum Data Analysis Software software and summarized into PDF format analysis methods and standard files. This method is based on the second cathode assisted discharge technology, and systematically investigates key parameters of glow discharge such as discharge voltage, current, and gas flow rate. Analyze mass spectrometry interference and eliminate the influence of interference factors on detection data. Use the instrument's built-in relative sensitivity factor or internal control sample to calibrate the measurement result data and improve data accuracy. Batch collection of sample detection data, calculation of detection limits, precision and other related data through mathematical statistical methods, to form a high-purity rare earth oxide and halide reagent trace impurity element GD-MS analysis method and supporting standard dataset.
", "ds_ref_instruction": "" } }, "submit_center_id": "ncdc", "data_level": 0, "recommendation_value": 0, "license_type": "https://creativecommons.org/licenses/by/4.0/", "doi_reg_from": "reg_local", "cstr_reg_from": "reg_local", "doi_not_reg_reason": null, "cstr_not_reg_reason": null, "is_paper_in_submitting": false, "ds_topic_tags": [ "高纯稀土氧化物和卤化物", "GD-MS", "关键敏感元素" ], "ds_subject_tags": [ "工程与技术科学基础学科" ], "ds_class_tags": [], "ds_locus_tags": [], "ds_time_tags": [], "ds_contributors": [ { "true_name": "陈雄飞", "email": "chenxiongfei@gbtcgroup.com", "work_for": "国合通用测试评价认证股份公司", "country": "中国" }, { "true_name": "赵艳", "email": "zhaoyan@gbtcgroup.com", "work_for": "国标（北京）检验认证有限公司", "country": "中国" } ], "ds_meta_authors": [ { "true_name": "赵艳", "email": "zhaoyan@gbtcgroup.com", "work_for": "国标（北京）检验认证有限公司", "country": "中国" } ], "ds_managers": [ { "true_name": "陈雄飞", "email": "chenxiongfei@gbtcgroup.com", "work_for": "国合通用测试评价认证股份公司", "country": "中国" } ], "category": "其他" }